Tarvos System Picture

Tarvos IEC 61000-4-2 Waveform Tester

The GTS Tarvos provides convenient pulse testing of devices, applying the system level IEC 61000-4-2 testing method to components at the wafer, packaged device, board, or sub-assembly level via a 50 ohm cable.

By utilizing this controlled impedance path the system eliminates the uncertainty and errors in testing associated with using gun based testers by providing a reliable and repeatable IEC pulse to DUTs, and meeting the new ESDA HMM Standard Practice.

Advantages

  • Compatible with established testing protocols
  • Highly repeatable pulse waveform
  • Precise stress testing at the wafer, packaged device, or board levels
  • EM radiated pulses effectively eliminated
  • Controlled, lower impedance current path direct to device under test (DUT)
  • Reduced impact of device resistance change on applied stress
  • Convenient operation: Conventional 50Ω coaxial cable connections
  • Quick connection to any device or test fixture board
  • Computer-controlled for automated testing
  • Extensible via system upgrades

Elliminates Gun Problems

  • No reproducibility problems
  • No large, imprecise gun tip
  • No separate ground return cable
  • No special test set up with coupling planes
  • No test fixture board reflections from impedance mismatches
  • No electromagnetic pulse interference

With Tarvos it is easy to apply a sequence of stress pulses, monitor and measure the stress pulses, measure leakage between pulses to detect failure, and detect DUT impedance changes due to DUT heating.

The system has been designed to apply stress pulses consistantly and reproducibly while elliminating the unpredictability guns impart through variations in EM pulses and reflections in transmission paths. The Tarvos tester allows easy testing of subassemblies, packaged devices, and wafer-level devices with just one system.

Because the 50Ω transmission path is maintained using RF cables, connectors, and microstrip transmission lines all the way to the DUT, peak stress current reduction due to distortions is effectively eliminated.

Specifications

Rise Time 700ps to 1000ps
I Peak 3.75 A/kV* +/- 10%
I 30ns 2.0 A/kV* +/- 20%
I 60ns 1.0 A/kV* +/- 20%
Voltage Range 100V to 8kV*
Maximum Current 30A @ 8kV into a 50Ω load

*Equivalent IEC Gun Voltage

Optional Capabilities

  • High Current of up to 16kV equivalent IEC gun discharge voltage
  • Device failure detection with Keithley 2400 or 26XX SourceMeter® upgrade
  • Current pulse recording with oscilloscope upgrade
  • Wafer test kit configurable wafer probes and matched cabling set